[PDF.90sj] Cluster Secondary Ion Mass Spectrometry: Principles and Applications
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Cluster Secondary Ion Mass Spectrometry: Principles and Applications
Christine M. Mahoney
[PDF.ay38] Cluster Secondary Ion Mass Spectrometry: Principles and Applications
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| #5152865 in Books | 2013-07-15 | Original language:English | PDF # 1 | 9.40 x1.00 x6.30l,1.68 | File type: PDF | 380 pages|
Explores the impact of the latest breakthroughs in cluster SIMS technology
Cluster secondary ion mass spectrometry (SIMS) is a high spatial resolution imaging mass spectrometry technique, which can be used to characterize the three-dimensional chemical structure in complex organic and molecular systems. It works by using a cluster ion source to sputter desorb material from a solid sample surface. Prior to the advent of the cluster source, SIMS was severe...
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